Spectrolaser Target

The Spectrolaser Target instrument adds a new dimension to the Spectrolaser range.

Fully equipped with high-resolution scanning options in either single axis, two axis or three-axis scan modes, the Spectrolaser Target allows elemental mapping of surfaces in addition to precise inspection at any position on the analysed sample.

Each Target comes complete with an on-axis camera system with variable zoom, and cross-hair laser targeting to allow precise analysis on any point of the sample surface.

The full analytical features of other Spectrolaser products are included in the Target range, including optical emission line identification, calibration to standard samples, and multiple reporting features.

A range of laser options is available including 90, 200 and 300 mJ laser energies (1064nm, IR) in addition to 532 and 355nm options. Please contact one of our application specialists for advice on your particular needs.

APPLICATIONS

The Spectrolaser Target was originally developed by Laser Analysis Technologies Pty Ltd (LAT) to aid gemologists in gem classification. It has since found numerous other applications in material classification and process control.

In gemstone classification it has found application in such institutions as the Gem and Jewelry Institute of Thailand where the instrument is used to classify gemstones from around the world. In this instance the instrument is used to identify beryllium doping of corundum (sapphire) that changes a particular stone's colour and thereby significantly (and artificially) increase the gem's value.

To aid gemstone classification LAT has replaced the infra-red 1064nm Nd:YAG laser typically used in Spectrolaser instruments with an ultraviolet 355nm frequency tripled Nd:YAG laser.

The UV laser produces a smaller focal point and is only absorbed at the very surface of the gem thereby producing an inconsequentially small area of laser damage. Also Included in the Spectrolaser Target is a cross-hair targeting camera system and a precisely adjustable mounting assembly that enables quick and easy positioning of the laser strike-point on the gemstone.

The result is minimal gem damage during the analysis process, such as the laser mark shown right on the girdle of a sapphire (at 60x magnification). This particular laser crater is approximately 50 microns in diameter and was a result of five laser pulses at full laser power. Using one laser pulse an operator can reduce the laser mark to virtually imperceptible levels while still achieving the elemental analysis. All Spectrolasers have computer controlled laser power for easy operation.

Small laser crater on sapphire girdle

Comparison spectra for Be doped and undoped SapphiresApplications of the instrument in gemmology are widespread. For example, the identification of beryllium treated sapphire is easily accomplished with the Spectrolaser Target by monitoring the distinctive Be emission at 313.106 nm. Shown left is the comparison between treated and un-treated sapphire where the Be treatment is easily identified.
Another gemmology application of the Spectrolaser is the identification of coated gemstones. For example, cobalt coating of natural topaz is a means of changing the colour of the stone. Shown right is the comparison of natural and coated topaz where the difference is quite dramatic and distinctive. In addition to qualitative comparisons such as these, quantitative elemental analysis can also be achieved via calibration with standard materials.

An intuitive control interface assists in rapid targeting of the gemstone, element identification, quantification of elemental concentrations, file saving and reporting.

Shown below is the operator view of a gemstone in the instrument. The cross-hairs indicate the position of the laser on the gemstone.

Further Applications

The elemental mapping capability of the Spectrolaser Target has found further application in a range of industries.

In the production of steel plate for example (POSCO, Korea) Spectrolaser Target systems are used to accurately map surface variations in the steel composition such as a variation in the titanium levels below.

Routine quantitative analysis of steel is obtained via calibration to standard samples resulting in instrument calibrations such as the nickel calibration below.

Models

Spectrolaser Target MSpectrolaser Laser Induced Breakdown Spectrometer, four high-res spectrograph channels 190-950nm, control computer system, one customer specified calibration, 90mJ 1064nm Nd:YAG laser,3-axis manual sample positioning system, sample video and targeting system, spectrolaser analytical software
Spectrolaser Target - XYadd XY scanning ability and graphical interface
Spectrolaser Target - XYZadd XYZ scanning ability and graphical interface
Spectrolaser Target - 200 or 300add 200 mJ or 300mJ laser option
Spectrolaser Target - UV - 355 or 266add 355nm or 266nm UV option

Detailed Specifications

Laser:

Nd:YAG 1064nm 90, 200 and 300mJ options

75mJ 355nm also available.

Laser Energy:

software variable, 0 to Maximum Energy

Optical:

4 Czerny-Turner Spectrographs

Detector Type:

4 CCD

Detector Gating:

Computer controlled variable detector exposure delay,

-2 to 15 microseconds, 80nsec steps, <10nesc jitter

Wavelength Range

190 - 950nm, simultaneous acquisition

Resolution:

0.09 @ 300nm

Sample Positioning:

Standard: 3 axis precision manually operated translation stage.

Option: 1 to 3 axis stepper motor controlled sample scanning system.

Sample Chamber

Buffer gas capability- solenoid controlled gas supply.

A/D:

2MHz per channel

Analysis Time

1 second typical

Computer

USB plug-and-play

Software

- Spectrolaser analysis software

- element identification.

- Surface mapping capability, graphical interface

- User selectable analysis time and data averaging.

- Flexible report format options

- Lab manager security options

- Windows XP compatible

Power:

85-240VAC

Weight

Spectrometer: 45kg

Power Supply: 20kg

Computer: 16kg

Colour

White

Width

40cm

Length:

86cm

Height:

30cm

Class IV Laser Product

A for answers to frequently asked questions please see the FAQ link.


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